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Magnetron Sputtering
Scanning Electron Microscopy (SEM)
X-Ray Photoelectron Spectroscopy (XPS)
Tensile and Compression Test
Wafer Curvature System
Energy Dispersive Spectroscopy (EDS)
X-Ray Diffraction (XRD)
Nanoindentation
Corrosion Test
High Vacuum Systems
Focused Ion Beam (FIB)
Electron Backscattered Diffraction (EBSD)
Electro-Discharge Machining (EDM)