Scanning Electron Microscopy (SEM) employs a focused electron beam to generate secondary and backscattered electrons for high-resolution imaging of surface morphology and microstructure. When coupled with EDS, SEM enables qualitative and quantitative elemental analysis.
Image Source: (Captured by me, Electron Microscopy Center, University of Kentucky)
I used SEM to examine nanoporous surface morphology and ligament networks formed after thermal processing. High-resolution imaging enabled direct observation of pore structure and feature uniformity. Quantitative image analysis was performed to statistically measure ligament size distributions.
The image illustrates a plane view of nanoporous material, captured by Helios Nanolab SEM.
I employed SEM to assess thin-film surface quality, continuity, and overall morphology prior to mechanical and corrosion testing. SEM imaging was also used to evaluate film thickness and detect defects that could influence performance. This ensured consistency across samples selected for further characterization.
The image illustrates some cracks and non-uniformity on AlCrNiCoFe thin films.
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