I used focused ion beam milling to prepare site-specific cross-sections of thin films for subsurface analysis. FIB cross-sections revealed pore connectivity, film thickness, and interfaces with the substrate. This information was critical for correlating processing conditions with three-dimensional microstructure. 

I performed FIB cross-sectioning to accurately measure thin-film thickness and prepare regions of interest for further analysis. Precise site preparation enabled reliable compositional and structural characterization across multiple samples. FIB was also used to support complementary SEM and EDS analyses