Embedded Files
Phase, Texture, and Residual Stress Analysis
Phase, Texture, and Residual Stress Analysis
X-ray Diffraction (XRD) is used to identify crystalline phases, preferred orientation, and residual stress in thin films and bulk materials. It enables evaluation of phase stability, lattice parameters, and stress evolution as a function of processing conditions.
Image Source: (Captured by me, Electron Microscopy Center, University of Kentucky)
I used XRD to identify crystal structure and confirm phase stability in thin films before and after thermal processing. Diffraction analysis verified retention of single-phase structures under optimized processing conditions. XRD provided a critical link between processing, structure, and properties.
I applied XRD to evaluate phase evolution during high-temperature annealing of thin films and bulk alloys. Comparative analysis before and after thermal exposure enabled assessment of structural stability. These measurements guided selection of processing conditions for stable alloy performance.
Check Others
Page updated
Google Sites
Report abuse